System and Method to Measure CAR-T Cell Quality
M. Dandin, C-Y. Lin, “System and Method to Measure CAR-T Cell Quality”, United States Patent Application No. 18/316,200, filed May 11, 2023
M. Dandin, C-Y. Lin, “System and Method to Measure CAR-T Cell Quality”, United States Patent Application No. 18/316,200, filed May 11, 2023
M. Dandin, “Silicon Photomultiplier with in-Microcell Adaptation Mechanism,” United States Provisional Patent Application No. 62/638,135, filed Mar. 3, 2018.
M. Dandin, “Single-Photon Avalanche Diode Circuit with Variable Hold-off Time and Dual Delay Regime,” United States Patent No. 9,671,284, issued Jun. 6, 2017.
M. Dandin, “Delay Circuit with Dual Delay Resolution Regime,” United States Patent Application No. 15/496,924, filed Apr. 25, 2017.
M. Dandin, “Circuit and Method for Locally Controlling Breakdown Voltage and Performance in a Silicon Photomultiplier Array,” United States Provisional Patent Application No. 62/435,586, filed Dec. 16, 2016.
M. Dandin, “Programmable Delay Cell and Delay Line, and Readout Circuit Including The Same,” United States Provisional Patent Application No. 62/278,585, filedJan. 14, 2016.