Machine Learning Identification and Classification of Cancer Cell Behaviors in a Lab-on-CMOS Capacitance Sensing Platform

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Ching-Yi Lin, Marc Dandin. Machine Learning Identification and Classification of Cancer Cell Behaviors in a Lab-on-CMOS Capacitance Sensing Platform. TechRxiv. May 30, 2024.

Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study

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U. Noyan, S. Lu, A. Al-Shabili, M. Dandin, S. H. Chan and P. Abshire, “Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 875-879

Field Uniformity Optimization for Integrated Capacitance Sensing of Tumor Treating Field-Treated Cancer Cell Cultures

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Y. Gilpin, J. Yankel and M. Dandin, “Field Uniformity Optimization for Integrated Capacitance Sensing of Tumor Treating Field-Treated Cancer Cell Cultures,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 728-732

Measuring and modeling macrophage proliferation in a lab-on-CMOS capacitance sensing microsystem

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Smith K, Lin C-Y, Gilpin Y, Wayne E and Dandin M (2023) Measuring and modeling macrophage proliferation in a lab-on-CMOS capacitance sensing microsystem.

Tracking the Effects of Tumor Treating Fields on Human Breast Cancer Cells in vitro Using a Capacitance Sensing Lab-on-CMOS Microsystem

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Y. Gilpin, C. -Y. Lin, M. Forssell, S. Zheng, P. Grover and M. Dandin, “Tracking the Effects of Tumor Treating Fields on Human Breast Cancer Cells in vitro Using a Capacitance Sensing Lab-on-CMOS Microsystem,” 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Glasgow, United Kingdom, 2022, pp. 1-4

CMOS Bioelectronics: Current and Future Trends

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C-Y. Lin, M. S. Sajal, Y. Gilpin, F. Dehghandehnavi, A. Batueva, K-C. Lin, N. McFarlane, M. Dandin (2022) ‘CMOS Bioelectronics: Current and Future Trends’, in Bioelectronics. Boca Raton: CRC Press, pp. 93–107

True Random Number Generation Using Dark Noise Modulation of a Single-Photon Avalanche Diode

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M. S. Sajal and M. Dandin, “True Random Number Generation Using Dark Noise Modulation of a Single-Photon Avalanche Diode,” in IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 71, no. 3, pp. 1586-1590, March 2024

Towards CMOS Capacitance Sensors for DNA Origami Characterization

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M. S. R. Sajal et al., “Towards CMOS Capacitance Sensors for DNA Origami Characterization,” 2023 International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2023, pp. 1-4

Challenge-Response Pair Space Enhancement for Imager-Based Physically Unclonable Functions

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M. S. Sajal and M. Dandin, “Challenge-Response Pair Space Enhancement for Imager-Based Physically Unclonable Functions,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 217-221

Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager

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F. Dehghandehnavi, M. S. Sajal, K. -C. Lin and M. Dandin, “Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 317-321