Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study

U. Noyan, S. Lu, A. Al-Shabili, M. Dandin, S. H. Chan and P. Abshire, "Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study," 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 875-879 [Online Article]

Pulsed Time-of-Flight (ToF) LiDAR is a crucial technology for acquiring depth information in various applications, including autonomous vehicles, robotics, and 3D mapping. Single-Photon Avalanche Diodes (SPADs) are widely employed as detectors in these systems due to their fast response and high sensitivity. This paper investigates pulsed ToF LiDAR-based depth imaging to clarify the hardware design considerations that affect depth estimation accuracy. We present a simulation study that investigates the performance of SPAD-based LiDAR systems under various conditions, offering insights into the design of SPAD circuits for improved depth imaging performance. We find that, as expected, accuracy and depth resolution depend strongly on the fill factor, with accuracy decreasing as the fill factor drops, gradually at first and then more steeply for fill characteristics of less than 50%. Lastly, we discuss the outcomes of our simulations and suggest directions for future research in this area.