C. -Y. Lin and M. Dandin, “Machine Learning Identification and Classification of Mitosis and Migration of Cancer Cells in a Lab-on-CMOS Capacitance Sensing platform,” IEEE Journal of Biomedical and Health Informatics, Nov. 2024
F. Dehghandehnavi, M.S. Sajal, and M. Dandin, “Surface-Modified CMOS Biosensors” Front. Bioeng. Biotechnol., vol 12, Nov. 2024.
K. Smith, C.-Y. Lin, Y. Gilpin, E. Wayne, and M. Dandin, “Measuring and Modeling Macrophage Proliferation in a Lab-on-CMOS Capacitance Sensing Microsystem,” Front. Bioeng. Biotechnol. vol. 11:1159004, May 2023.
M. S. Sajal and M. Dandin, “True Random Number Generation Using Dark Noise Modulation of a Single-Photon Avalanche Diode,” IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 71, no. 3, pp. 1586-1590, Mar. 2024
B. Senevirathna, S. Lu, M. Dandin, E. Smela, and P. Abshire, “Correlation of Capacitance and Microscopy Measurements using Image Processing for a Lab-on-CMOS Microsystem,” IEEE Trans. Biomed. Circuits Syst., Sep. 2019.
B. Senevirathna, S. Lu, M. Dandin, J. Basile, E. Smela, and P. Abshire, “High Resolution Monitoring of Chemotherapeutic Agent Potency in Cancer Cells using a CMOS Capacitance Biosensor,” Biosensors and Bioelectronics, vol. 142, p. 111501, Oct. 2019.
B. Senevirathna, S. Lu, M. Dandin, J. Basile, E. Smela, and P. Abshire, “Real-Time Measurements of Cell Proliferation using a Lab-on-CMOS Capacitance Sensor Array,” IEEE Trans. Biomed. Circuits Syst., vol. 12, no. 3, pp. 510–520, Jun. 2018.
M. Dandin, M. Habib, B. Nouri, P. Abshire, and N. McFarlane, “Characterization of Single-Photon Avalanche Diodes in a 0.5 μm Standard CMOS Process—Part 2: Equivalent Circuit Model and Geiger mode Readout,” IEEE Sens. J., vol. 16, no. 9, pp. 3075–3083, May 2016.
M. Dandin, P. Abshire, and E. Smela, “Polymer Filters for Ultraviolet-Excited Integrated Fluorescence Sensing,” J. Micromechanics Microengineering, vol. 22, no. 9, p. 095018, Sep. 2012.
M. Dandin and P. Abshire, “High Signal-to-Noise Ratio Avalanche Photodiodes with Perimeter Field Gate and Active Readout,” IEEE Electron Device Lett., vol. 33, no. 4, pp. 570–572, Apr. 2012.
