Characterization of Single-Photon Avalanche Diodes in a 0.5 μm Standard CMOS Process—Part 2: Equivalent Circuit Model and Geiger mode Readout
M. Dandin, M. Habib, B. Nouri, P. Abshire, and N. McFarlane, “Characterization of Single-Photon Avalanche Diodes in a 0.5 μm Standard CMOS Process—Part 2: Equivalent Circuit Model and Geiger mode Readout,” IEEE Sens. J., vol. 16, no. 9, pp. 3075–3083, May 2016.








