Perimeter-Gated Single-Photon Avalanche Diode Imager with Vanishing Room Temperature Dark Count Probability

M. S. Sajal, K. -C. Lin, B. Senevirathna, S. Lu and M. Dandin, “Perimeter-Gated Single-Photon Avalanche Diode Imager with Vanishing Room Temperature Dark Count Probability,” 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Glasgow, United Kingdom, 2022, pp. 1-4

Lessons Learned the Hard Way

T. Delbruck, I.  A. M. Elfadel, S. Muzaffar, G. Haessig, et al., “Lessons Learned the Hard Way,” 2020 IEEE International Symposium on Circuits and Systems (ISCAS), Sevilla, 2020, pp. 1-18

System-on-a-chip for automated cell assays using a lab-on-CMOS platform

System-on-a-Chip for Automated Cell Assays using a Lab-on-CMOS Platform

B. Senevirathna, S. Lu, N. Renegar, M. Dandin, E. Smela, and P. Abshire, “System-on-a-Chip for Automated Cell Assays using a Lab-on-CMOS Platform,” in 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 2019, pp. 1-5.

System integration of IC chips for lab-on-CMOS applications

System Integration of IC Chips for Lab-on-CMOS Applications

S. Lu, B. Senevirathna, M. Dandin, E. Smela, and P. Abshire, “System Integration of IC Chips for Lab-on-CMOS Applications,” in 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, pp. 1–5.

Cybersecurity and the electric grid- Innovation and intellectual property

Cybersecurity and the Electric Grid: Innovation and Intellectual Property

T. A. Wood and M. Dandin, “Cybersecurity and the Electric Grid: Innovation and Intellectual Property,” in 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 2017, pp. 1–1.

Near breakdown spectral responsivity of perimeter-gated single-photon avalanche diodes

Near Breakdown Spectral Responsivity of Perimeter-Gated Single-Photon Avalanche Diodes

M. Dandin and P. Abshire, “Near Breakdown Spectral Responsivity of Perimeter-Gated Single-Photon Avalanche Diodes,” in 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS), 2017, pp. 867–870.

Lab-on-CMOS capacitance sensor array for real-time cell viability measurements

Lab-on-CMOS Capacitance Sensor Array for Real-Time Cell Viability Measurements with I2C Readout

B. Senevirathna, A. Castro, M. Dandin, E. Smela, and P. Abshire, “Lab-on-CMOS Capacitance Sensor Array for Real-Time Cell Viability Measurements with I2C Readout,” in 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, pp. 2863–2866.

Large-area low-noise single-photon avalanche diodes in standard CMOS

Large-Area Low-Noise Single-Photon Avalanche Diodes in Standard CMOS

B. Nouri, M. Dandin, and P. Abshire, “Large-Area Low-Noise Single-Photon Avalanche Diodes in Standard CMOS,” in 2012 IEEE Sensors, 2012, pp. 1–5.

Confession session- learning from others’ mistakes

Confession Session: Learning from Others’ Mistakes

P. Abshire, A. Bermak, R. Berner, G. Cauwenberghs, S. Chen, J. B. Christen, T. Constandinou, E. Culurciello, M. Dandin, T. Datta, T. Delbruck, P. Dudek, A. Eftekhar, R. Etienne-Cummings, G. Indiveri, M. K. Law, B. Linares-Barranco, J. Tapson, W. Tang, Y. Zhai, “Confession Session: Learning from Others’ Mistakes,” in 2011 IEEE International Symposium of Circuits and Systems (ISCAS), 2011, pp. 1149–1162.

Optoelectronic characterization of 4H-SiC avalanche photodiodes operated in DC and in Geiger mode

Optoelectronic Characterization of 4H-SiC Avalanche Photodiodes Operated in DC and in Geiger Mode

M. Dandin, A. Akturk, A. Vert, S. Soloviev, P. Sandvik, S. Potbhare, N. Goldsman, P. Abshire, and K. P. Cheung, “Optoelectronic Characterization of 4H-SiC Avalanche Photodiodes Operated in DC and in Geiger Mode,” in 2011 IEEE International Semiconductor Device Research Symposium (ISDRS), 2011, pp. 1–2.