Lessons Learned the Hard Way
T. Delbruck, I. A. M. Elfadel, S. Muzaffar, G. Haessig, et al., “Lessons Learned the Hard Way,” 2020 IEEE International Symposium on Circuits and Systems (ISCAS), Sevilla, 2020, pp. 1-18
System-on-a-chip for automated cell assays using a lab-on-CMOS platform
B. Senevirathna, S. Lu, N. Renegar, M. Dandin, E. Smela, and P. Abshire, “System-on-a-chip for automated cell assays using a lab-on-CMOS platform,” in 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 2019, pp. 1-5.
System integration of IC chips for lab-on-CMOS applications
S. Lu, B. Senevirathna, M. Dandin, E. Smela, and P. Abshire, “System integration of IC chips for lab-on-CMOS applications,” in 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, pp. 1–5.
Near breakdown spectral responsivity of perimeter-gated single-photon avalanche diodes
M. Dandin and P. Abshire, “Near breakdown spectral responsivity of perimeter-gated single-photon avalanche diodes,” in 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS), 2017, pp. 867–870.
Cybersecurity and the electric grid: Innovation and intellectual property
T. A. Wood and M. Dandin, “Cybersecurity and the electric grid: Innovation and intellectual property,” in 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 2017, pp. 1–1.
Lab-on-CMOS capacitance sensor array for real-time cell viability measurements with I2C readout
B. Senevirathna, A. Castro, M. Dandin, E. Smela, and P. Abshire, “Lab-on-CMOS capacitance sensor array for real-time cell viability measurements with I2C readout,” in 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, pp. 2863–2866.
Large-area low-noise single-photon avalanche diodes in standard CMOS
B. Nouri, M. Dandin, and P. Abshire, “Large-area low-noise single-photon avalanche diodes in standard CMOS,” in 2012 IEEE Sensors, 2012, pp. 1–5.
Confession session: learning from others’ mistakes
P. Abshire, A. Bermak, R. Berner, G. Cauwenberghs, S. Chen, J. B. Christen, T. Constandinou, E. Culurciello, M. Dandin, T. Datta, T. Delbruck, P. Dudek, A. Eftekhar, R. Etienne-Cummings, G. Indiveri, M. K. Law, B. Linares-Barranco, J. Tapson, W. Tang, Y. Zhai, “Confession session: learning from others’ mistakes,” in 2011 IEEE International Symposium of Circuits and Systems (ISCAS), 2011, pp. 1149–1162.
Optoelectronic characterization of 4H-SiC avalanche photodiodes operated in DC and in Geiger mode
M. Dandin, A. Akturk, A. Vert, S. Soloviev, P. Sandvik, S. Potbhare, N. Goldsman, P. Abshire, and K. P. Cheung, “Optoelectronic characterization of 4H-SiC avalanche photodiodes operated in DC and in Geiger mode,” in 2011 IEEE International Semiconductor Device Research Symposium (ISDRS), 2011, pp. 1–2.
Modeling of perimeter-gated silicon avalanche diodes fabricated in a standard single-well CMOS process
A. Akturk, M. Dandin, N. Goldsman, and P. Abshire, “Modeling of perimeter-gated silicon avalanche diodes fabricated in a standard single-well CMOS process,” in 2009 IEEE International Semiconductor Device Research Symposium (ISDRS), 2009, pp. 1–2.
