Bias Variation Compensation in Perimeter-Gated SPAD TRNGs

M. S. Sajal, H. Guthrie and M. Dandin, “Bias Variation Compensation in Perimeter-Gated SPAD TRNGs,” 2025 68th International Midwest Symposium on Circuits and Systems (MWSCAS), Lansing, MI, USA, 2025

Dynamic Watermark Generation for Digital Images using Perimeter Gated SPAD Imager PUFs

M. S. Sajal and M. Dandin, “Dynamic Watermark Generation for Digital Images using Perimeter Gated SPAD Imager PUFs,” 2025 68th International Midwest Symposium on Circuits and Systems (MWSCAS), Lansing, MI, USA, 2025

Towards a Lab-on-a-Chip as a Service (LoCaaS) Framework for in Vitro Cancer Cell Assays

C. -Y. Lin, Y. Gilpin, Z. Chen, E. Wayne and M. Dandin, “Towards a Lab-on-a-Chip as a Service (LoCaaS) Framework for in Vitro Cancer Cell Assays,” 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Sherbrooke, QC, Canada, 2024, pp. 268-272

Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study

U. Noyan, S. Lu, A. Al-Shabili, M. Dandin, S. H. Chan and P. Abshire, “Pulsed ToF LiDAR-Based Depth Imaging: SPAD Circuit Considerations and Simulation Study,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 875-879

Field Uniformity Optimization for Integrated Capacitance Sensing of Tumor Treating Field-Treated Cancer Cell Cultures

Y. Gilpin, J. Yankel and M. Dandin, “Field Uniformity Optimization for Integrated Capacitance Sensing of Tumor Treating Field-Treated Cancer Cell Cultures,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 728-732

Tracking the Effects of Tumor Treating Fields on Human Breast Cancer Cells in vitro Using a Capacitance Sensing Lab-on-CMOS Microsystem

Y. Gilpin, C. -Y. Lin, M. Forssell, S. Zheng, P. Grover and M. Dandin, “Tracking the Effects of Tumor Treating Fields on Human Breast Cancer Cells in vitro Using a Capacitance Sensing Lab-on-CMOS Microsystem,” 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Glasgow, United Kingdom, 2022, pp. 1-4

Towards CMOS Capacitance Sensors for DNA Origami Characterization

M. S. R. Sajal et al., “Towards CMOS Capacitance Sensors for DNA Origami Characterization,” 2023 International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2023, pp. 1-4

Challenge-Response Pair Space Enhancement for Imager-Based Physically Unclonable Functions

M. S. Sajal and M. Dandin, “Challenge-Response Pair Space Enhancement for Imager-Based Physically Unclonable Functions,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 217-221

Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager

F. Dehghandehnavi, M. S. Sajal, K. -C. Lin and M. Dandin, “Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager,” 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS), Tempe, AZ, USA, 2023, pp. 317-321

Concealable Physically Unclonable Functions and Key Generation Using a Geiger Mode Imager

M. S. Sajal and M. Dandin, “Concealable Physically Unclonable Functions and Key Generation Using a Geiger Mode Imager,” 2023 IEEE International Symposium on Circuits and Systems (ISCAS), Monterey, CA, USA, 2023, pp. 1-5